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Effect of Periodic Modulation of Tungsten Oxide Magnetron Deposition Angle upon the Obtained Layer Structure according to X-Ray Reflectometry Measurements.
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- Glass Physics & Chemistry, 2021, v. 47, n. 1, p. S63, doi. 10.1134/S1087659621070075
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- Article
Composition, structure, and morphology of the surface of nanodimensional platinum-containing films obtained from sols.
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- Glass Physics & Chemistry, 2016, v. 42, n. 1, p. 78, doi. 10.1134/S1087659616010168
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- Article
Mutually Beneficial Combination of Molecular Dynamics Computer Simulations and Scattering Experiments.
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- Membranes, 2021, v. 11, n. 7, p. 507, doi. 10.3390/membranes11070507
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- Article
Reference samples for the spatial characteristics of nanostructures based on amorphous multilayer coatings.
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- Measurement Techniques, 2013, v. 56, n. 6, p. 605, doi. 10.1007/s11018-013-0252-8
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- Article
X-Ray Reflectometry of the Adsorption Octadecanamide Film at the Toluene–Water Interface.
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- Journal of Experimental & Theoretical Physics, 2019, v. 129, n. 3, p. 368, doi. 10.1134/S1063776119090061
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- Article
X-Ray Reflectometry of DMPS Monolayers on a Water Substrate.
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- Journal of Experimental & Theoretical Physics, 2017, v. 125, n. 6, p. 1051, doi. 10.1134/S1063776117120093
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- Article
Surface-induced breakout crystallization in cylinder-forming P(I-b-EO) diblock copolymer thin films.
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- European Physical Journal E -- Soft Matter, 2011, v. 34, n. 1, p. 1, doi. 10.1140/epje/i2011-11007-x
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- Article
Influence of Temperature on the Conformational Guided Physical Properties of Ultrathin Films of PLLA.
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- Defence Science Journal, 2014, v. 64, n. 3, p. 309, doi. 10.14429/dsj.64.7329
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- Article
Effect of electron-beam treatment of sensor glass substrates for SPR devices on their metrological characteristics.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2019, v. 22, n. 4, p. 444, doi. 10.15407/spqeo22.04.444
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- Article
The Influence of the Power Supply of a Magnetron Sputtering System on the Properties of the Deposited TiO<sub>2</sub> Films.
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- Inorganic Materials, 2018, v. 54, n. 15, p. 1491, doi. 10.1134/S0020168518150025
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- Article
Pt and Pd Nanoparticle Crystallization in the Sol-Gel-Derived Thin SiO 2 Films.
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- Physchem, 2023, v. 3, n. 2, p. 259, doi. 10.3390/physchem3020018
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- Article
Influence of Radiation Exposure on the Magnetic Properties of Ferromagnetic/IrMn Films with Exchange Bias.
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- Technical Physics, 2024, v. 69, n. 7, p. 2014, doi. 10.1134/S1063784224070235
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- Article
Deep X-Ray Reflectometry of Supermultiperiod A<sub>3</sub>B<sub>5</sub> Structures with Quantum Wells Grown by Molecular-Beam Epitaxy.
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- Technical Physics, 2020, v. 65, n. 11, p. 1822, doi. 10.1134/S1063784220110134
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- Article
Improvement of surface and interface roughness estimation on X-ray reflectivity.
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- Powder Diffraction, 2014, v. 29, n. 3, p. 265, doi. 10.1017/S0885715614000359
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- Article
Improvement of X-ray reflectivity calculations on a multilayered surface.
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- Powder Diffraction, 2013, v. 28, n. 2, p. 100, doi. 10.1017/S0885715613000110
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- Article
Quick X-ray reflectivity of spherical samples.
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- Powder Diffraction, 2013, v. 28, n. 2, p. 105, doi. 10.1017/S0885715613000134
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- Article
Enhancement of the hydrophobicity and oleophobicity of a polyurethane coating using a fluorine‐free polyfarnesene‐based polyol.
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- Journal of Applied Polymer Science, 2024, v. 141, n. 9, p. 1, doi. 10.1002/app.55010
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- Article
Influence of contamination layer on thickness evaluation by X‐ray reflectometry.
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- XRS: X-ray Spectrometry, 2019, v. 48, n. 5, p. 345, doi. 10.1002/xrs.3006
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- Article
Professional.
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- 2018
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- Publication type:
- Proceeding
Signatures of different carbon bonds in graphene oxide from soft x-ray reflectometry.
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- XRS: X-ray Spectrometry, 2015, v. 44, n. 6, p. 468, doi. 10.1002/xrs.2653
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- Article
Experimental determination of reference intensity ratio essential for accurate thickness measurement of HfO<sub>2</sub> ultrathin films by XPS.
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- Surface & Interface Analysis: SIA, 2024, v. 56, n. 6, p. 337, doi. 10.1002/sia.7293
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- Article
Review on the thickness measurement of ultrathin oxide films by mutual calibration method.
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- Surface & Interface Analysis: SIA, 2022, v. 54, n. 4, p. 405, doi. 10.1002/sia.7040
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- Article
Soft X‐ray characterization of ion beam sputtered magnesium oxide (MgO) thin film.
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- Surface & Interface Analysis: SIA, 2018, v. 50, n. 11, p. 1145, doi. 10.1002/sia.6446
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- Article
Study of the Au‐Cr bilayer system using X‐ray reflectivity, GDOES, and ToF‐SIMS.
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- Surface & Interface Analysis: SIA, 2018, v. 50, n. 11, p. 1213, doi. 10.1002/sia.6445
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- Article
Observation of surface contamination layer by X-ray reflectometry (XRR) analyses.
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- Surface & Interface Analysis: SIA, 2017, v. 49, n. 6, p. 522, doi. 10.1002/sia.6188
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- Article
Surface and interface roughness estimations by X-ray reflectivity and RBS measurements.
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- Surface & Interface Analysis: SIA, 2014, v. 46, n. 12/13, p. 1208, doi. 10.1002/sia.5644
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- Article
Traceable thickness determination of organic nanolayers by X-ray reflectometry.
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- Surface & Interface Analysis: SIA, 2014, v. 46, n. 10/11, p. 911, doi. 10.1002/sia.5371
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- Publication type:
- Article
Chain-Melting Phase Transition in a Lamellar Film of Dimyristoyl-Phosphatidylserine on the Surface of a Silica Hydrosol.
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- Crystallography Reports, 2024, v. 69, n. 3, p. 365, doi. 10.1134/S1063774524600509
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- Article
Confirmation of no Structural and Chemical Changes in Curie Temperature Variable Co Ultrathin Films by Electric Field.
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- Zeitschrift für Physikalische Chemie, 2016, v. 230, n. 4, p. 569, doi. 10.1515/zpch-2015-0648
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- Article
Effect of Annealing on Stress, Microstructure, and Interfaces of NiV/B 4 C Multilayers.
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- Coatings (2079-6412), 2024, v. 14, n. 4, p. 513, doi. 10.3390/coatings14040513
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- Publication type:
- Article
Atomic Layer Deposition of Chlorine Containing Titanium–Zinc Oxide Nanofilms Using the Supercycle Approach.
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- Coatings (2079-6412), 2023, v. 13, n. 5, p. 960, doi. 10.3390/coatings13050960
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- Article
Protection of Cu from Oxidation by Ta Capping Layer.
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- Coatings (2079-6412), 2023, v. 13, n. 5, p. 926, doi. 10.3390/coatings13050926
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- Article
Features of the Composition and Photoluminescent Properties of Porous Silicon Depending on Its Porosity Index.
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- Coatings (2079-6412), 2023, v. 13, n. 2, p. 385, doi. 10.3390/coatings13020385
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- Article
Structural and Magnetic Specificities of Fe-B Thin Films Obtained by Thermionic Vacuum Arc and Magnetron Sputtering.
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- Coatings (2079-6412), 2022, v. 12, n. 10, p. 1592, doi. 10.3390/coatings12101592
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- Article
Experimental Study of Irradiation of Thin Oxide and Mo/Si Multilayers by High Brightness Broadband VUV/UV Radiation and Their Degradation.
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- Coatings (2079-6412), 2022, v. 12, n. 2, p. 290, doi. 10.3390/coatings12020290
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- Article
Surface Topography of Si/TiO 2 Stacked Layers on Silicon Substrate Deposited by KrF Excimer Laser Ablation.
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- Coatings (2079-6412), 2021, v. 11, n. 11, p. 1350, doi. 10.3390/coatings11111350
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- Article
Plasma Enhanced Atomic Layer Deposition of Tantalum (V) Oxide.
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- Coatings (2079-6412), 2021, v. 11, n. 10, p. 1206, doi. 10.3390/coatings11101206
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- Article
The Effect of the Deposition Method on the Structural and Optical Properties of ZnS Thin Films.
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- Coatings (2079-6412), 2021, v. 11, n. 9, p. 1064, doi. 10.3390/coatings11091064
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- Publication type:
- Article
Internal Structure and Temporal Stability of Hard X-ray Pd/B 4 C Multilayer Mirrors under Different Humidity Environments.
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- Coatings (2079-6412), 2021, v. 11, n. 3, p. 262, doi. 10.3390/coatings11030262
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- Publication type:
- Article
Assessment of Potential of the High-Voltage Anodic Plasma Source to Deposit Multilayer Structures Relevant to X-ray Mirror Applications.
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- Coatings (2079-6412), 2020, v. 10, n. 6, p. 531, doi. 10.3390/coatings10060531
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- Article
Invited: Investigation of Carbon/Copper Multilayer to Examine the Influence of Copper Coating on the Li-Storage Performance of Carbon.
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- Energies (19961073), 2023, v. 16, n. 6, p. 2740, doi. 10.3390/en16062740
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- Article
Synthesis of WS 2 Ultrathin Films by Magnetron Sputtering Followed by Sulfurization in a Confined Space.
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- Surfaces (2571-9637), 2024, v. 7, n. 1, p. 108, doi. 10.3390/surfaces7010008
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- Publication type:
- Article
Probing Surface Morphology using X-ray Grating Interferometry.
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- Scientific Reports, 2019, v. 9, n. 1, p. N.PAG, doi. 10.1038/s41598-019-50486-5
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- Publication type:
- Article
Hydrogen Absorption in Metal Thin Films and Heterostructures Investigated in Situ with Neutron and X-ray Scattering.
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- Metals (2075-4701), 2016, v. 6, n. 6, p. 125, doi. 10.3390/met6060125
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- Publication type:
- Article
Extracting chemical information from single-wavelength X-ray reflectivity data.
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- European Physical Journal - Applied Physics, 2013, v. 62, n. 1, p. 00, doi. 10.1051/epjap/2013130120
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- Article
Influence of Etching Modes on the Morphology and Composition of the Surface of Multilayer Porous Silicon.
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- Semiconductors, 2024, v. 58, n. 2, p. 145, doi. 10.1134/S106378262402009X
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- Publication type:
- Article
Photoluminescence and Transmission Electron Microscopy Methods for Characterization of Super-Multiperiod A3B5 Quantum Well Structures.
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- Semiconductors, 2019, v. 53, n. 14, p. 1914, doi. 10.1134/S1063782619140094
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- Publication type:
- Article
Matched X-Ray Reflectometry and Diffractometry of Super-Multiperiod Heterostructures Grown by Molecular Beam Epitaxy.
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- Semiconductors, 2019, v. 53, n. 14, p. 1910, doi. 10.1134/S1063782619140082
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- Article
Reflectometry of X-ray Whispering Gallery Waves Propagating along Liquid Meniscuses.
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- Semiconductors, 2018, v. 52, n. 16, p. 2049, doi. 10.1134/S1063782618160091
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- Publication type:
- Article
Study of multilayered SiGe semiconductor structures by X-ray diffractometry, grazing-incidence X-ray reflectometry, and secondary-ion mass spectrometry.
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- Semiconductors, 2013, v. 47, n. 12, p. 1556, doi. 10.1134/S1063782613120221
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- Article