Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleThickness Considerations of Two-Dimensional Layered Semiconductors for Transistor Applications.AuthorsZhang, Youwei; Li, Hui; Wang, Haomin; Xie, Hong; Liu, Ran; Zhang, Shi-Li; Qiu, Zhi-JunPublicationScientific Reports, 2016, p29615ISSN2045-2322Publication typeArticleDOI10.1038/srep29615