Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleFast XRD<sup>2</sup> Microdiffraction with Focusing X-Ray Microlenses.AuthorsBerthold, Christoph; Bjeoumikhov, Aniouar; Brügemann, LutzPublicationParticle & Particle Systems Characterization, 2009, Vol 26, Issue 3, p107ISSN0934-0866Publication typeArticleDOI10.1002/ppsc.200800038