Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleCharacterization and Optimization of OSTEM; A Novel Detection Method for Single- and Multi-Beam Scanning Electron Microscopy.AuthorsKievits, Arent; Fermie, Job; Duinkerken, Peter; Lane, Ryan; Carroll, Elizabeth; Giepmans, Ben; Hoogenboom, JacobPublicationMicroscopy & Microanalysis, 2022, Vol 28, p1458ISSN1431-9276Publication typeAbstractDOI10.1017/S143192762200592X