Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleSecondary Ion Mass Spectrometry on the Helium Ion Microscope: methodologies for analysis of nanomaterials.AuthorsAudinot, Jean-Nicolas; Vollnhals, Florian; Gratia, Paul; Eswara, Santhana; Philipp, Patrick; Wirtz, TomPublicationMicroscopy & Microanalysis, 2018, Vol 24, p1016ISSN1431-9276Publication typeAbstractDOI10.1017/S1431927618005573