Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleNon-Diffractive Electron Bessel Beams for Scanning Electron Microscopy in Transmission Mode Using Direct Phase Masks.AuthorsHettler, Simon; Dries, ManuelPublicationMicroscopy & Microanalysis, 2017, Vol 23, p592ISSN1431-9276Publication typeArticleDOI10.1017/S1431927617003646