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- Title
Description of force surfaces in atomic force microscopy with allowance for the mobility of the lattice atoms.
- Authors
Blagov, E. V.; Mostepanenko, V. M.; Klimchitskaya, G. L.
- Abstract
The surfaces of constant force and the profiles of the horizontal component of the force during scanning of the tip of an atomic force microscope above the surface of a close-packed lattice in the contact mode are calculated taking account of the mobility of the lattice atoms. It is shown that when the mobility is taken into account, the previously observed discontinuities on the surface of constant force arise at smaller scanning forces on the tip above the surface than in the immobile-atom approximation. The force surfaces arising when scanning above vacancies are obtained. The possibility of using atomic force microscopy data for diagnostics of point defects on a solid surface is discussed. © 1999 American Institute of Physics.
- Subjects
ATOMIC force microscopy; ATOMS
- Publication
Technical Physics, 1999, Vol 44, Issue 8, p970
- ISSN
1063-7842
- Publication type
Article
- DOI
10.1134/1.1259415