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- Title
Structural and optical properties of Bi[sub 3.25] La[sub 0.75] Ti[sub 3] O[sub 12] ferroelectric thin films prepared by chemical solution methods.
- Authors
Wang, G.S.; Meng, X.J.; Lai, Z.Q.; Yu, J.; Sun, J.L.; Guo, S.L.; Chu, J.H.
- Abstract
Ferroelectric Bi[sub 3.25] La[sub 0.75] Ti[sub 3] O[sub 12] (BLT) thin films have been grown on Pt/Ti/SiO[sub 2] /Si substrates by chemical solution methods. X-ray diffraction analysis shows that BLT thin films are polycrystalline with (171)-preferential orientation. Atomic force microscopy investigation shows that they have large grains about 120 nm in size. A Pt/BLT/Pt capacitor has been fabricated and showed excellent ferroelectricity, with a remnant polarization and coercive field of 24 μC/cm[sup 2] and 116 kV/cm, respectively. The capacitor shows no polarization fatigue up to 10[sup 9] switching cycles. The optical constants (n,k) of the BLT thin films in the wavelength range 0.35–1.7 μm were obtained by spectroscopic ellipsometry measurements, and the band-gap energy was found to be about 3.25 eV.
- Subjects
FERROELECTRIC devices; THIN films; ATOMIC force microscopy
- Publication
Applied Physics A: Materials Science & Processing, 2003, Vol 76, Issue 1, p83
- ISSN
0947-8396
- Publication type
Article
- DOI
10.1007/s003390201305