We found a match
Your institution may have access to this item. Find your institution then sign in to continue.
- Title
1759. Dynamics of electrical charge carriers in Mg-doped TiO<sub>2</sub> thin films under reducing conditions.
- Authors
Sriubas, Mantas; Bockute, Kristina; Virbukas, Darius; Laukaitis, Giedrius
- Abstract
Mg-doped TiO2 thin ceramic films prepared using e-beam deposition were characterized by energy-dispersive X-ray spectroscopy, X-ray diffraction (XRD), and impedance spectrometer. The influence of the concentration of Mg dopant and systematic investigation of the dynamics of electronic charge carriers' transport in the thin films are provided. The dopants concentration affected structural properties and nonlinear behaviour of electrical conductivity of the thin films. XRD analysis revealed anatase structure of TiO2 thin films with the decrease of cristallinity by increasing the concentration of Mg dopant. Total conductivity and activation energy depend on Mg concentration and the ambient temperature. The highest total conductivities 6.17E-6 S/cm and 5.50E-4 S/cm were achieved using 1.2 mol % (873 K) and 2.5 mol % (1230 K) dopant concentrations respectively. The highest relaxation frequencies and shortest relaxation times of 4.92E-02 s at 833 K and 3.48E-05 s at 1230 K temperature are obtained for the same experimental points, whereas the longest relaxation times 3.18E-01 s at 833 K and 1.21E-04 s at 1230 K temperature were estimated for 8 mol % Mg-doped TiO2 films.
- Subjects
ELECTRIC properties of thin films; TITANIUM dioxide films; ELECTRIC charge; MECHANICAL vibration research; ENGINEERING; MATHEMATICAL models
- Publication
Journal of Vibroengineering, 2015, Vol 17, Issue 6, p3333
- ISSN
1392-8716
- Publication type
Article