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- Title
A Built-in Single Event Upsets Detector for Sequential Cells.
- Authors
Li, Yuanqing; Wang, Haibin; Li, Lixiang; Chen, Li; Liu, Rui; Chen, Mo
- Abstract
A built-in single event upsets (SEUs) detector is presented in this paper. This detector utilizes charge sharing to detect an SEU in a sequential cell, and the detection process is analyzed through Accuro simulations in a 65 nm technology. The normal operation of this detector would not induce obvious performance degradation of the target circuit. Through using this detector, error correction can be achieved based on dual modular redundancy (DMR) while the related power is about 20.4 % lower than that induced by triple modular redundancy (TMR).
- Subjects
ERROR correction (Information theory); CHARGE sharing (Digital electronics); SINGLE event effects; MICROELECTRONICS; COMPLEMENTARY metal oxide semiconductors; COMPUTER-aided design; LINEAR energy transfer
- Publication
Journal of Electronic Testing, 2016, Vol 32, Issue 1, p11
- ISSN
0923-8174
- Publication type
Article
- DOI
10.1007/s10836-015-5560-2