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- Title
Klein's supplementary runs rules on X¯$\overline{X}$ chart to control the mean of a Weibull random variable.
- Authors
Ho, Linda Lee; Quinino, Roberto Costa; Fernandes, Fidel Henrique; Bourguignon, Marcelo
- Abstract
Most of the papers found in the literature concerned monitoring a process mean of a quality characteristic normally distributed. However, in several practical situations (like in reliability studies), the engineering team also desires to monitor a process mean in which the quality characteristic follows other probabilistic distributions, such as the Weibull. In this paper, we monitor a process mean of a random variable following a Weibull distribution using the traditional X¯$\overline{X}$ control chart. To improve the performance, Klein's two of two supplementary run rule is included in the X¯$\overline{X}$ chart. Such adoption promotes better performance, producing faster signals of abnormal situations (in terms of average run length) than the traditional X¯$\overline{X}$ chart in a great variety of shifts. An empirical example illustrates the proposed scheme.
- Subjects
QUALITY control charts; WEIBULL distribution; STOCHASTIC processes; RANDOM variables
- Publication
Quality & Reliability Engineering International, 2022, Vol 38, Issue 4, p1750
- ISSN
0748-8017
- Publication type
Article
- DOI
10.1002/qre.3044