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- Title
Variation in Refractive Index and Extinction Coefficient of a Very Thin Copper Film by Thermal Annealing: an Ellipsometric Approach.
- Authors
Somakumar, Ajeesh Kumar
- Abstract
A pure experiment-based work was conducted to investigate the optical characteristics of a thin absorbing singlelayer copper film at various annealing temperatures. The study also systematically examined the utilization of spectroscopic ellipsometry as an effective tool for fine-tuning the optical constants of thin films, particularly for achieving specific refractive index (n) and extinction coefficient (k) values. The measurement and analysis involved a thermally deposited thin nanosized single-layer copper film on a glass substrate, along with a spectroscopic ellipsometer.
- Subjects
COPPER films; THIN films; METALLIC films; OPTICAL constants; ELLIPSOMETRY; REFRACTIVE index
- Publication
Journal of Applied Spectroscopy, 2023, Vol 90, Issue 5, p1092
- ISSN
0021-9037
- Publication type
Article
- DOI
10.1007/s10812-023-01637-0