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- Title
Analysis of the structure and magnetic properties of an interface in multilayered (Fe/Si) nanostructures with the surface-sensitive XMCD method.
- Authors
Platunov, M.; Varnakov, S.; Zharkov, S.; Bondarenko, G.; Weschke, E.; Schierle, E.; Ovchinnikov, S.
- Abstract
The structural and magnetic properties of (Fe/Si) nanostructures obtained by successive deposition on the SiO/Si(100) surface at a temperature of the substrate of 300 K have been studied. The thicknesses of all Fe and Si layers have been determined by transmission electron microscopy measurements. The magnetic properties have been studied by the X-ray magnetic circular dichroism (XMCD) method near the Fe L absorption edges. The orbital ( m) and spin ( m) contributions to the total magnetic moment of iron have been separated. The thicknesses of magnetic and nonmagnetic iron silicide on the Si/Fe and Fe/Si interfaces have been determined with the surface sensitivity of the XMCD method and the model of the interface between the nonmagnetic and weakened magnetic phases.
- Subjects
NANOSTRUCTURES; MAGNETIC properties; CIRCULAR dichroism; SILICON oxide; CRYSTAL structure; TRANSMISSION electron microscopy
- Publication
JETP Letters, 2014, Vol 99, Issue 12, p706
- ISSN
0021-3640
- Publication type
Article
- DOI
10.1134/S002136401412011X