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- Title
Meeting SiC and GaN measurement challenges.
- Authors
STALFFER, LEE
- Abstract
The article provides information on the strategies developed by Keithley, designer and producer of advanced electrical test instruments and systems for electronics manufacturers, to meet the challenges of measuring SiC and GaN devices. Developments by Keithley are the SourceMeter source-measure units, cabling and interconnect, test fixtures and probe station interfaces. Also discussed are Keithley's focus on data conversion and its implementation of the Test Script Processor (TSP) platform.
- Subjects
KEITHLEY Instruments Inc.; ELECTRICAL test equipment; MEASURING instruments; ELECTRONIC equipment; ELECTRONIC apparatus &; appliance manufacturing
- Publication
EE: Evaluation Engineering, 2015, Vol 54, Issue 9, p32
- ISSN
0149-0370
- Publication type
Article