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- Title
Variation of the Reflection Coefficient of Semiconductors in a Wavelength Range from 0.2 to 20μm under the Action of Ultrasonic Waves.
- Authors
Zaveryukhin, B. N.; Zaveryukhina, N. N.; Tursunkulov, O. M.
- Abstract
The effect of ultrasonic waves on the spectral coefficient of radiation reflection from the surface of semiconductors used in solar energy converters is considered. A change in the reflectance of semiconductors before and after ultrasonic treatment is determined. It is shown that acoustic stimulation of the semiconductor surface and subsurface layers determines the radiation reflection conditions.
- Subjects
ULTRASONIC waves; SEMICONDUCTORS
- Publication
Technical Physics Letters, 2002, Vol 28, Issue 9, p752
- ISSN
1063-7850
- Publication type
Article
- DOI
10.1134/1.1511774