Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleIn-Situ Liquid Phase Electron Microscopy of Beam-Sensitive Materials.AuthorsWu, Hanglong; Ianiro, Alessandro; van Rijt, Mark M. J.; Keizer, Arthur D. A.; Esteves, A. Catarina C.; Tuinier, Remco; Friedrich, Heiner; Sommerdijk, Nico. A.J.M.; Patterson, Joseph P.PublicationMicroscopy & Microanalysis, 2019, Vol 25, p63ISSN1431-9276Publication typeAbstractDOI10.1017/S1431927618016045