We found a match
Your institution may have access to this item. Find your institution then sign in to continue.
- Title
Simultaneous Phase-Stepping Shearography Measurements Using Multiple Wavelengths and a Color Camera.
- Authors
Richoz, G.; Schajer, G.
- Abstract
Shearography and other applications of Electronic Speckle Pattern Interferometry (ESPI) are typically done using a single monochromatic light source with a monochrome camera. This arrangement enables full-field measurements of a single deformation quantity according to the particular arrangement of the optical system. If a further deformation quantity is to be measured, then the associated optical arrangement must be used sequentially. Here, an alternative approach is described where multiple interferometric measurements are simultaneously made using a color camera imaging monochromatic light sources of different wavelengths. The Red-Green-Blue (RGB) sensors of a conventional Bayer type camera can be read separately, thereby providing three independent color signals and independent ESPI phase maps. This technique is applied here to extend the measurement opportunities available with phase-stepping shearography.
- Subjects
SHEAROGRAPHY; WAVELENGTHS; ELECTRONIC speckle pattern interferometry; CAMERAS; MONOCHROMATIC light; LIGHT sources
- Publication
Experimental Mechanics, 2015, Vol 55, Issue 6, p1165
- ISSN
0014-4851
- Publication type
Article
- DOI
10.1007/s11340-015-0022-4