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- Title
Interface microstructure in epitaxial YBa[sub 2] Cu[sub 3] O[sub x] /PrBa[sub 2] Cu[sub 3] O[sub x] /YBa[sub 2] Cu[sub 3] O[sub x] ramp-type Josephson junctions.
- Authors
Gao, J.; Yang, Y.; Sun, J.L.
- Abstract
Abstract. The interlaces in ramp-type YBa[sub 2]Cu[sub 3]O[sub x]/ PrBa[sub 2]Cu[sub 3]O[sub x]/YBa[sub 2]Cu[sub 3]O[sub x] Josephson junctions with different ramp slopes were characterized electrically and structurally. From the cross-sectional TEM images, it has been found that the epitaxy remains through all layers even on the ramp surface, providing the ramp angle is less than 45 degrees. No big defects such as grain boundaries and secondary phases occurred at the interface. The major defects which appeared at the interlace are antiphase boundaries which were formed by lattice shifts with c/3 unit between PrBa[sub 2]Cu[sub 3]O[sub x] and YBa[sub 2]Cu[sub 3]O[sub x]. The interface between YBa[sub 2]Cu[sub 3]O[sub x] base-layer and PrBa[sub 2]Cu[sub 3]O[sub x] barrier is more defective in comparison with that between PrBa[sub 2]Cu[sub 3]O[sub x] barrier and top-layer. Alteration of the ramp slope from 10 degrees to 45 degrees leads to a significant increase in the density of defects near the base-YBa[sub 2]Cu[sub 3]O[sub x]/PrBa[sub 2]Cu[sub 3]O[sub x] interface. The average roughness of the ramp surface created by ion milling is about 10 nm, which seems insensitive to the ramp slope. The damaged ramp surface could be repaired during the subsequent deposition process, leading to a negligible interlace resistance.
- Subjects
JOSEPHSON junctions; EPITAXY; INTERFACES (Physical sciences); YTTRIUM alloys
- Publication
Applied Physics A: Materials Science & Processing, 2000, Vol 70, Issue 1, p107
- ISSN
0947-8396
- Publication type
Article
- DOI
10.1007/s003390050021