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- Title
Lichtfeld-Tiefenschätzung für die Vermessung teilspiegelnder Oberflächen.
- Authors
Uhlig, David; Heizmann, Michael
- Abstract
Deflectometry analyses surfaces by indirect observation of a known reference scene via the reflection in the surface itself. But, it requires additional knowledge, e.g. about one surface point, in order to measure surface gradients very precisely. Light field cameras as optical 3D measuring devices allow to measure the distance to the surface as well as to the reference scene when observing partially reflecting surfaces. In this paper an approach is presented that effectively combines this dualdepth estimation with deflectometry. By formulating the surface reconstruction as a variation problem, the depth is fused with the deflectometric gradients. Experiments validate the method and show that high accuracy in the reconstruction is achieved.
- Subjects
LIGHT-field cameras; SURFACE reconstruction; SURFACE analysis
- Publication
Technisches Messen, 2020, Vol 87, ps9
- ISSN
0171-8096
- Publication type
Article
- DOI
10.1515/teme-2020-0022