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- Title
3-D Microstructural Characterization: Methods, Analysis, and Applications.
- Authors
Uchic, Michael D.
- Abstract
The author comments on the development of devices that are capable of interrogating the structure, chemistry and/or crystallography of materials in three dimensions (3-D) in response to the need for high-fidelity characterization and analysis of microstructure. It also discusses various reports published within the issue, including one by E. Lauridsen et al on the advancements in synchrotron-based 3-D x-ray methods and another by M. DeGraef et al on the 3-D visualization of pearlite colonies.
- Subjects
THREE-dimensional imaging; MICROSTRUCTURE; MATERIALS science; MATERIALS analysis; SYNCHROTRONS
- Publication
JOM: The Journal of The Minerals, Metals & Materials Society (TMS), 2006, Vol 58, Issue 12, p24
- ISSN
1047-4838
- Publication type
Editorial
- DOI
10.1007/BF02748490