We found a match
Your institution may have access to this item. Find your institution then sign in to continue.
- Title
A fraction defective based capability index.
- Authors
De Souza Borges, Wagner; Lee Ho, Linda
- Abstract
Two problems greatly affect the use of capability indices such as <UEQN>$C_p$</UEQN>, <UEQN>$C_{pk}$</UEQN> and <UEQN>$C_{pkm}$</UEQN>: the lack of affinity with the process fraction defective π and the difficulty of dealing with the sampling distributions of their natural estimators. In this paper, a capability index which is in one-to-one correspondence with π is introduced and simple inferential procedures under a Bayesian perspective are developed to facilitate its use in industrial applications. Copyright © 2001 John Wiley & Sons, Ltd.
- Subjects
BAYESIAN analysis; INDEXES; RELIABILITY in engineering; ENGINEERING; INDUSTRIAL arts
- Publication
Quality & Reliability Engineering International, 2001, Vol 17, Issue 6, p447
- ISSN
0748-8017
- Publication type
Article
- DOI
10.1002/qre.438