We found a match
Your institution may have access to this item. Find your institution then sign in to continue.
- Title
Electrical characterization and reliability evaluation of capacitors by means of in situ leakage current measurements.
- Authors
Manca, J. V.; Croes, K.; De Schepper, L.; De Ceuninck, W.; Stals, L. M.; Jacques, L.; Tielemans, L.; Gerrits, N.; Hoppener, R.
- Abstract
The in situ leakage current measurement technique is presented for the high-resolution observation of the electrical behaviour of dielectric material systems, e.g. capacitors, at high temperatures. This technique is useful for the electrical characterization of dielectrics during linear heating experiments and/or isothermal steps. Applied to a population of test structures, the in situ leakage current measurement technique is a rapid and powerful tool to assess the reliability and quality of dielectric components and assemblies. Results obtained on populations of film capacitors and ceramic capacitors are presented. © 1998 John Wiley & Sons, Ltd.
- Subjects
CAPACITORS; RELIABILITY in engineering; ELECTRICITY; STATISTICAL reliability; DIELECTRIC measurements; DIELECTRIC devices
- Publication
Quality & Reliability Engineering International, 1998, Vol 14, Issue 2, p63
- ISSN
0748-8017
- Publication type
Article
- DOI
10.1002/(SICI)1099-1638(199803/04)14:2<63::AID-QRE160>3.0.CO;2-P