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- Title
Expression of Concern: Electrical Study of Trapped Charges in Copper-Doped Zinc Oxide Films by Scanning Probe Microscopy for Nonvolatile Memory Applications.
- Abstract
6 December 2010; 97 (23): 232103. doi: 10.1063/1.3521281 4 Kumar Amit, Herng Tun Seng, Zeng Kaiyang, and Ding JunBipolar Charge Storage Characteristics in Copper and Cobalt Co-doped Zinc Oxide (ZnO) Thin FilmACS Applied Materials & Interfaces20124 (10), 5276-5280doi: 10.1021/am301220h References 1 Su T, Zhang H (2017) Electrical Study of Trapped Charges in Copper-Doped Zinc Oxide Films by Scanning Probe Microscopy for Nonvolatile Memory Applications.
- Subjects
SCANNING probe microscopy; NONVOLATILE memory; ZINC oxide films; DOPING agents (Chemistry); KELVIN probe force microscopy
- Publication
PLoS ONE, 2023, Vol 17, Issue 6, p1
- ISSN
1932-6203
- Publication type
Correction Notice
- DOI
10.1371/journal.pone.0288213