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- Title
Electron microscopy: Hydrogen brightens up.
- Authors
Batson, Philip E.
- Abstract
The article focuses on the annular dark-field (ADF) imaging mode of the scanning transmission electron microscope (STEM). It relates that the annular dark-field STEM imaging is aimed to suppress diffraction contrast among crystalline materials and is successfully used to produce quantitative and atomic-level structure in thin sections of bulk materials. It cites the study of Ishikawa and colleagues, which deals on the effectiveness of the ADF.
- Subjects
SCANNING transmission electron microscopy; OPTICAL diffraction; CRYSTALLINE interfaces; IMAGING compatibility of biomedical materials; CONTRAST media
- Publication
Nature Materials, 2011, Vol 10, Issue 4, p270
- ISSN
1476-1122
- Publication type
Article
- DOI
10.1038/nmat2993