We found a match
Your institution may have access to this item. Find your institution then sign in to continue.
- Title
Injection and Retention Characterization of Trapped Charges in Electret Films by Electrostatic Force Microscopy and Kelvin Probe Force Microscopy.
- Authors
Wang, Jin; Zhang, He; Cao, Guo-sheng; Xie, Ling-hai; Huang, Wei
- Abstract
Charge trapping memory has become a promising memory device due to its reliability, low cost, and simplicity. Its storage mechanism has attracted increasing attention. The properties of the storage layer are very important for the research of the device performance and mechanism. Herein, the technologies for the charge trapping properties of the storage layer are introduced first and then the study of charge trapping by electrostatic force microscopy (EFM) and Kelvin probe force microscopy (KPFM) is reviewed. The properties of trapped charges for inorganic, polymers, nanomaterials, and organic small molecules are reviewed, when different experimental parameters such as the atmospheric moisture, injection time\bias, and hydrophilicity of films are used. The injection and retention mechanisms are also summarized.
- Subjects
KELVIN probe force microscopy; HUMIDITY; COMPUTER storage devices; SMALL molecules
- Publication
Physica Status Solidi. A: Applications & Materials Science, 2020, Vol 217, Issue 20, p1
- ISSN
1862-6300
- Publication type
Article
- DOI
10.1002/pssa.202000190