Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleCharacterization of x-rays emerging from between reflector and sample carrier in reflector-assisted TXRF analysis.AuthorsTsuji, Kouichi; Delalieux, FilipPublicationXRS: X-ray Spectrometry, 2004, Vol 33, Issue 4, p281ISSN0049-8246Publication typeArticleDOI10.1002/xrs.722