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- Title
Spectral characteristics of nanometer-thick chromium films in terahertz frequency range.
- Authors
Andreev, V.; Angeluts, A.; Vdovin, V.; Lukichev, V.
- Abstract
The spectral characteristics (reflection, transmission, and absorption coefficients) of thin chromium films on silica substrates have been measured using a pulsed source of terahertz radiation. The spectra of optical coefficients were obtained in a frequency range of 0.25-1.1 THz. Dependences of the optical coefficients on the metal film thickness at 1 THz were constructed. The maximum absorption coefficient (43%) was observed at a film thickness of 10 nm.
- Subjects
CHROMIUM films; NANOSTRUCTURED materials; THICKNESS measurement; SUBSTRATES (Materials science); SUBMILLIMETER waves; TERAHERTZ materials
- Publication
Technical Physics Letters, 2015, Vol 41, Issue 2, p180
- ISSN
1063-7850
- Publication type
Article
- DOI
10.1134/S1063785015020170