Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleNondestructive Determination of the Characteristics of Porous Silicon Carbide Layers.AuthorsShuman, V. B.; Savkina, N. S.AbstractIt shown that the porosity and thickness of a porous silicon carbide layer can be nondestructively monitored provided that the sample weight loss upon electrochemical etching is known and the reflectance spectrum exhibits interference.SubjectsSILICON carbide; POROUS materialsPublicationTechnical Physics Letters, 2002, Vol 28, Issue 11, p902ISSN1063-7850Publication typeArticleDOI10.1134/1.1526877