Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleCharge trapping characterization in the thin oxide layer/non-conductive substrate system.AuthorsLiebault, J.; Moya-Siesse, D.; Bernardini, J.; Moya, G.PublicationSurface & Interface Analysis: SIA, 2002, Vol 34, Issue 1, p668ISSN0142-2421Publication typeArticleDOI10.1002/sia.1384