Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleHigh spatial resolution X-ray spectra of Mg, Al, Si and P L-emission observed with a newly developed soft X-ray spectrometer for EPMA.AuthorsMurano, T.; Takahashi, H.; Handa, N.; Terauchi, M.; Koike, M.; Kawachi, T.; Takashi, I.; Hasegawa, N.; Koeda, M.; Nagano, T.; Sasai, H.; Oue, Y.; Yonezawa, Z.; Kuramoto, S.AbstractExtended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.SubjectsELECTRON probe microanalysis; X-ray spectrometersPublicationMicroscopy & Microanalysis, 2012, Vol 18, Issue S2, p776ISSN1431-9276Publication typeAbstractDOI10.1017/S1431927612005739