Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleFocused Ion Beam Sample Preparation of Complex Devices.AuthorsRussell, P. E.; Bunker, K. L.; Garcia, R.; Stark, T. J.; Vitarelli, J. P.PublicationMicroscopy & Microanalysis, 2005, Vol 11, p88ISSN1431-9276Publication typeArticleDOI10.1017/S1431927605501284