Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleAnalysis of reliability test results for CMDS LSI and VLSI circuits.AuthorsPetrukhin, B. P.; Shavykin, N. A.AbstractThe reliability test results for CMDS LSI and VLSI circuits manufactured by Xilinx and Altera are analyzed. Upper estimates of failure rate with confidence probability P = 0.9 are obtained for all types of digital chips supplied by these companies.SubjectsELECTRONIC circuits; XILINX Inc.; ALTERA Corp.PublicationAutomation & Remote Control, 2011, Vol 72, Issue 2, p449ISSN0005-1179Publication typeArticleDOI10.1134/S0005117911020226