We found a match
Your institution may have access to this item. Find your institution then sign in to continue.
- Title
Studies of Materials at the Nanometer Scale Using Coherent X-Ray Diffraction Imaging.
- Authors
Sandberg, Richard; Huang, Zhifeng; Xu, Rui; Rodriguez, Jose; Miao, Jianwei
- Abstract
For many years, x-ray microscopy has been attractive for materials studies with its ability to image thick samples and provide nanometer-scale resolution. However, the ability to manufacture high-resolution x-ray optics has been a hurdle to achieving the full potential of diffraction limited x-ray imaging. Recently, the advent of bright and coherent x-ray sources at synchrotrons and x-ray free electron lasers has enabled a lensless imaging technique called coherent diffractive imaging (CDI). Since it was first demonstrated in 1999, CDI has been rapidly developing into a materials imaging technique with resolutions approaching a few nanometers. This review provides an overview of the development of CDI and several applications to nanometer-scale imaging in two and three dimensions of biological and condensed mater materials. Also, we review the development of tabletop, coherent, soft x-ray sources that provide a complimentary and potentially more accessible source for nanometer-scale coherent imaging of materials.
- Subjects
NANOSTRUCTURED materials; X-ray diffraction; X-ray microscopy; FREE electron lasers; X-ray optics; CONDENSED matter
- Publication
JOM: The Journal of The Minerals, Metals & Materials Society (TMS), 2013, Vol 65, Issue 9, p1208
- ISSN
1047-4838
- Publication type
Article
- DOI
10.1007/s11837-013-0699-8