Found: 1
Select item for more details and to access through your institution.
RELIABILITY CHARACTERIZATION OF A 3-μm CMOS/SOS PROCESS.
- Published in:
- Quality & Reliability Engineering International, 1987, v. 3, n. 2, p. 99, doi. 10.1002/qre.4680030207
- By:
- Publication type:
- Article