We found a match
Your institution may have access to this item. Find your institution then sign in to continue.
- Title
ON THE MEASUREMENT AND INTERPRETATION OF RESIDUAL STRESS AT THE MICRO-SCALE.
- Authors
KORSUNSKY, ALEXANDER M.; BEMPORAD, EDOARDO; SEBASTIANI, MARCO; HOFMANN, FELIX; DAVE, SARAANSH
- Abstract
In the present paper we consider two representative methods for residual stress evaluation at the micro-scale: a (semi-)destructive method involving material removal and the measurement of strain relief; and a non-destructive X-ray diffraction technique involving the use of micro-focused synchrotron X-ray beam. A recently developed strain relief approach is described using a Focused Ion Beam (FIB) to create a circular trench of progressively increasing depth around a circular "island". Residual stress is evaluated by the comparison of the strain relief (measured by digital correlation of displacements or strains) with Finite Element simulations. The technique is illustrated for a thin TiN coating layer. The second approach uses focused synchrotron X-ray beams for white beam Laue diffraction. Demonstration experiments described involve in situ loading of commercially pure nickel foil. Procedures for validation and improvement of accuracy are discussed.
- Subjects
RESIDUAL stresses; DEFORMATIONS (Mechanics); METAL fatigue; STRAINS &; stresses (Mechanics); SYNCHROTRONS; PARTICLE accelerators
- Publication
International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2010, Vol 24, Issue 1/2, p1
- ISSN
0217-9792
- Publication type
Article
- DOI
10.1142/S0217979210063910