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- Title
Mapping Polar Distortions using Nanobeam Electron Diffraction and a Cepstral Approach.
- Authors
Holtz, Megan E; Padgett, Elliot; Johnston-Peck, Aaron C; Levin, Igor; Muller, David A; Herzing, Andrew A
- Abstract
Measuring local polar ordering is key to understanding ferroelectricity in thin films, especially for systems with small domains or significant disorder. Scanning nanobeam electron diffraction (NBED) provides an effective local probe of lattice parameters, local fields, polarization directions, and charge densities, which can be analyzed using a relatively low beam dose over large fields of view. However, quantitatively extracting the magnitudes and directions of polarization vectors from NBED remains challenging. Here, we use a cepstral approach, similar to a pair distribution function, to determine local polar displacements that drive ferroelectricity from NBED patterns. Because polar distortions generate asymmetry in the diffraction pattern intensity, we can efficiently recover the underlying displacements from the imaginary part of the cepstrum transform. We investigate the limits of this technique using analytical and simulated data and give experimental examples, achieving the order of 1.1 pm precision and mapping of polar displacements with nanometer resolution.
- Subjects
ELECTRON diffraction; OPTICAL distortion
- Publication
Microscopy & Microanalysis, 2023, Vol 29, Issue 4, p1422
- ISSN
1431-9276
- Publication type
Article
- DOI
10.1093/micmic/ozad070