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- Title
Dynamic crystal rotation resolved by high-speed synchrotron X-ray Laue diffraction.
- Authors
Huang, J. W.; J. C. E.; Huang, J. Y.; Sun, T.; Fezzaa, K.; Luo, S. N.
- Abstract
Dynamic compression experiments are performed on single-crystal Si under split Hopkinson pressure bar loading, together with simultaneous high-speed (250-350 ns resolution) synchrotron X-ray Laue diffraction and phase-contrast imaging. A methodology is presented which determines crystal rotation parameters, i.e. instantaneous rotation axes and angles, from two unindexed Laue diffraction spots. Two-dimensional translation is obtained from dynamic imaging by a single camera. High-speed motion of crystals, including translation and rotation, can be tracked in real time via simultaneous imaging and diffraction.
- Subjects
CRYSTALS spectra; X-ray diffraction; OPTICAL rotation; STRAIN rate; DYNAMIC loads; SINGLE crystals; LAUE experiment; SYNCHROTRON radiation
- Publication
Journal of Synchrotron Radiation, 2016, Vol 23, Issue 3, p712
- ISSN
0909-0495
- Publication type
Article
- DOI
10.1107/S160057751600223X