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- Title
Distinguishing crystallite size effects from those of structural disorder on the powder X-ray diffraction patterns of layered materials.
- Authors
Britto, Sylvia; Joseph, Sumy; Vishnu Kamath, P.
- Abstract
Both crystallite size effects and structural disorder contribute to the broadening of lines in the powder X-ray diffraction (PXRD) patterns of layered materials. Stacking faults, in particular, are ubiquitous in layered materials and aside from broadening also induce peaks due to select reflections to shift away from the Bragg positions. The effect of structural disorder has to be suitably discounted before the application of the Scherrer formula for the estimation of crystallite size.
- Subjects
CRYSTAL structure; NANOSTRUCTURED materials crystallography; CRYSTALLINE polymers; X-ray diffraction; SOLID state chemistry
- Publication
Journal of Chemical Sciences, 2010, Vol 122, Issue 5, p751
- ISSN
0974-3626
- Publication type
Article
- DOI
10.1007/s12039-010-0063-2