Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitlePast TTTC Events.SubjectsELECTRONIC circuits; BRIDGE circuits; COMPUTER software; HARDWARE; IEEE 802 standardPublicationJournal of Electronic Testing, 2017, Vol 33, Issue 3, p277ISSN0923-8174Publication typeArticleDOI10.1007/s10836-017-5662-0