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Title
A Correlation between the Microhardness and the Mobility of Twinning Dislocations in Bismuth Crystals Exposed to Constant Magnetic Field and Pulsed Electric Field.
It is established that bismuth crystals under the simultaneous action of a constant magnetic field and current pulses exhibit a correlation between the microhardness and the mobility of twinning dislocations. It is shown that application of the external fields favors translation of the twinning dislocations along the twin-matrix boundaries.