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- Title
X- RAY RADIATION DAMAGE IN SILICON STRIP DETECTORS.
- Authors
WIĄCEK, PIOTR; DĄBROWSKI, WŁADYSŁAW
- Abstract
The radiation damage effects in silicon strip and silicon pixel detectors caused by X-rays have become recently an important research topic driven mainly by development of new detectors for applications at the European X-ray Free Electron Laser (E-XFEL), where they will be exposed to extreme ionisation doses up to 1 GGy. Our investigation of radiation damage effects in a custom developed silicon strip detector to be used in laboratory diffractometers equipped with X-ray tubes shows that significant degradation of the detector performance occurs at low doses well below 100 Gy, which can be easily reached during normal operation of laboratory instruments. In the paper, basic mechanisms of radiation damage effects in silicon strip detectors are discussed and experimental results for a custom designed silicon strip detector for powder diffraction are presented.
- Subjects
X-ray research; RADIATION; FREE electron lasers; RADIATION damage; X-ray diffractometers
- Publication
Acta Physica Polonica B, 2016, Vol 47, Issue 2, p279
- ISSN
0587-4254
- Publication type
Article
- DOI
10.5506/APhysPolB.47.279