Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleDual-Lens Electron Holography for Junction Profiling and Strain Mapping of Semiconductor Devices.AuthorsWang, Y.Y.; Domenicucci, A.; Bruley, J.PublicationMicroscopy Today, 2014, Vol 22, Issue 3, p28ISSN1551-9295Publication typeArticleDOI10.1017/S1551929514000352