Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleIn-situ multi-modal microscopy using finely focused ion and electron beams.AuthorsWirtz, Tom; Castro, Olivier De; Audinot, Jean-Nicolas; Taubitz, Tatjana; Biesemeier, AntjePublicationMicroscopy & Microanalysis, 2021, Vol 27, p308ISSN1431-9276Publication typeAbstractDOI10.1017/S1431927621001677