Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleImaging Soft and Hard Dielectric Breakdown in Resistive Switching.AuthorsRegan, B. C.; Lodico, Jared; Chan, Ho Leung; Mecklenburg, Matthew; Hubbard, WilliamPublicationMicroscopy & Microanalysis, 2021, Vol 27, p2354ISSN1431-9276Publication typeAbstractDOI10.1017/S1431927621008461