Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleSensitivity of an Atomic Force Microscope Cantilever with a Crack.AuthorsLee, Haw-Long; Yang, Yu-Ching; Chang, Win-JinPublicationMicroscopy & Microanalysis, 2014, Vol 20, Issue S3, p1940ISSN1431-9276Publication typeArticleDOI10.1017/S143192761401143X