Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleExploring new frontiers with the Nion aberration-corrected STEM.AuthorsBacon, N.J.; Corbin, G.J.; Dellby, N.; Hrncirik, P.; Kurz, N.; Lovejoy, T.C.; Murfitt, M.F.; Skone, G.S.; Szilagyi, Z.S.; Krivanek, O.L.AbstractExtended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.SubjectsSCANNING transmission electron microscopyPublicationMicroscopy & Microanalysis, 2012, Vol 18, Issue S2, p1278ISSN1431-9276Publication typeAbstractDOI10.1017/S1431927612008240