Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleA Low-Temperature Scanning Tunneling Microscopy Investigation of Single Electron EffectsAuthorsDrechsler, T.; Chi, L. F.; Fuchs, H.PublicationScanning, 1998, Vol 20, Issue 4, p297ISSN0161-0457Publication typeArticleDOI10.1002/sca.1998.4950200402