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- Title
FACTORS INVOLVED IN ELECTRICALLY TESTING VLSI CIRCUITS.
- Authors
Hnatek, Eugene R.
- Abstract
Within the price of a very large scale integrated device, testing now looms as a large percentage of the total cost. The test cost mainly includes the capital cost of the automatic test equipment (ATE), the engineering cost of generating and debugging test patterns and programs, device design verification and the cost of volume testing. The design and fabrication of increasingly complex integrated circuits has created major new challenges for those involved in developing ATE software programs for testing these devices to ensure compliance with all electrical requirements.
- Subjects
VERY large scale circuit integration; AUTOMATIC test equipment; NONDESTRUCTIVE testing; TESTING equipment; QUALITY control; RELIABILITY in engineering
- Publication
Quality & Reliability Engineering International, 1986, Vol 2, Issue 2, p81
- ISSN
0748-8017
- Publication type
Article
- DOI
10.1002/qre.4680020204