Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleDeep Learning‐Assisted Quantification of Atomic Dopants and Defects in 2D Materials.AuthorsYang, Sang‐Hyeok; Choi, Wooseon; Cho, Byeong Wook; Agyapong‐Fordjour, Frederick Osei‐Tutu; Park, Sehwan; Yun, Seok Joon; Kim, Hyung‐Jin; Han, Young‐Kyu; Lee, Young Hee; Kim, Ki Kang; Kim, Young‐MinPublicationAdvanced Science, 2021, Vol 8, Issue 16, p1ISSN2198-3844Publication typeArticleDOI10.1002/advs.202101099