Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleDetection of Subsurface, Nanometer‐Scale Crystallographic Defects by Nonlinear Light Scattering and Localization.AuthorsShafiei, Farbod; Orzali, Tommaso; Vert, Alexey; Miri, Mohammad‐Ali; Hung, Pui Yee; Wong, Man Hoi; Alù, Andrea; Bersuker, Gennadi; Downer, Michael C.PublicationAdvanced Optical Materials, 2021, Vol 9, Issue 16, p1ISSN2195-1071Publication typeArticleDOI10.1002/adom.202002252